Advanced Production Testing of RF, SoC, and SiP Devices Joe Kelly

By: Kelly, JoeContributor(s): Engelhardt, MichaelMaterial type: TextTextPublication details: Bostan Artech House 2007Description: xx, 301pISBN: 158053709XSubject(s): Systems on a chip -- Testing | Radio frequencyDDC classification: 621.3815 KEL
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Electronics & Communication Engineering 		REFERENCE SECTION REF 621.3815 KEL (Browse shelf (Opens below)) Copy 1 Not for loan 021288
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