OPAC_KOHA catalog › Results of search for 'ccl=su:"Integrated circuits

Your search returned 3 results.

	1.	Random Testing of Digital Circuits: theory and applications Rene David by David, Rene. Material type: Text Publication details: New York Marcel Dekker Inc. 1998Availability: Items available for reference: Not for loanCall number: REF 621.3815 DAV (1). : Request article Add to cart (remove)
	2.	Testing of Digital Systems Niraj K. Jha by Jha, Niraj K \| Gupta, Sandeep. Material type: Text Publication details: London Cambridge University Press 2003Availability: Items available for reference: Not for loanCall number: REF 621.381548 JHA (1). : Request article Add to cart (remove)
	3.	Nanometer Technology Designs: high-quality delay tests Mohammad Tehranipoor by Tehranipoor, Mohammad H \| Ahmed, Nisar. Material type: Text Publication details: New York, NY Springer Verlag, Netherlands 2008Availability: Items available for reference: Not for loanCall number: REF 621.381548 TEH (1). : Request article Add to cart (remove)