Novel Algorithms for Fast Statistical Analysis of Scaled Circuits by Amith Singhee

By: Singhee, AmithContributor(s): Rutenbar, Rob AMaterial type: TextTextPublication details: London Springer Verlag, Netherlands 2009Description: xv, 195pISBN: 9789048130993Subject(s): Integrated circuits -- Computer-aided design | Novel Algorithms for Fast Statistical Analysis of Scaled CircuitsDDC classification: 621.381 SIN
Contents:
<p>Contents:</p> <p>1. SiLVR: projecti
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Electronics & Communication Engineering 		REFERENCE SECTION REF 621.381 SIN (Browse shelf (Opens below)) Copy 1 Not for loan 024429
Total holds: 0

<p>Contents:</p>

<p>1. SiLVR: projecti

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