Your search returned 3 results.

1.
Test Resource Partitioning for System-on-a-Chip by Chakrabarty, Krishnendu.

by Chakrabarty, Krishnendu.

Material type: Text Text Publication details: Boston Kluwer Academic Publishers 2002Availability: Items available for reference: Not for loanCall number: REF 621.3916 CHA (1). :

2.
High-Level Verification: methods and tools for verification of system-level designs by Sudipta Kundu

by Kundu, Sudipta | Gupta, Rajesh K | Lerner, Sorin.

Material type: Text Text Publication details: New York Springer Verlag, Netherlands 2011Availability: Items available for reference: Not for loanCall number: REF 621.381548 KUN (1). :

3.
Advanced Production Testing of RF, SoC, and SiP Devices Joe Kelly

by Kelly, Joe | Engelhardt, Michael.

Material type: Text Text Publication details: Bostan Artech House 2007Availability: Items available for reference: Not for loanCall number: REF 621.3815 KEL (1). :


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