RF and Microwave Modeling and Measurement Techniques for Compound Field Effect Transistors by Jianjun Gao

By: Gao, JianjunMaterial type: TextTextPublication details: Raleigh SciTech Publishing 2010Description: x, 339pISBN: 9781891121890Subject(s): field-effect transistors - Testing | Compound Semiconductors- TestingDDC classification: 621.3815 GAO
Contents:
<p>Contents:</p> <p>1. Representation
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Electronics & Communication Engineering 		REFERENCE SECTION REF 621.3815 GAO (Browse shelf (Opens below)) Copy 1 Not for loan 024432
Total holds: 0

<p>Contents:</p>

<p>1. Representation

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