000 00630nam a2200217Ia 4500
003 OSt
005 20230323131209.0
008 180620b2008 xxu||||| |||| 00| 0 eng d
020 _a038774746X
040 _cJUIT, Solan
082 _a621.381 TEH
100 _aTehranipoor, Mohammad
245 _aEmerging Nanotechnologies: test, defect tolerance, and reliability
_cby Mohammad Tehranipoor
260 _aNew York
_bSpringer
_c2008
300 _axii, 405p.
365 _a.00
505 _aContents: Section 1 Test and Defect Tol
650 _aNanotechnology
906 _a2dabf45b7f000001008ff5aa83aaa41d
942 _2ddc
_cRB
999 _c10528
_d10528