000 00565nam a2200193Ia 4500
008 180620b1990 xxu||||| |||| 00| 0 eng d
020 _a0824783956
082 _a621.36 SIR
100 _aSirohi, Rajpal S.
245 _aOptical Components, Systems and Measurment Techniques
_cRajpal S. Sirohi
260 _aNew York
_bMarcel Dekker Inc.
_c1990
300 _aviii, 445p.
365 _a.00
650 _aoptical instruments
650 _aOptical measurments
650 _aLasers
700 _akothiyal, Mahendra P.
906 _a2dbf26b57f0000010011fcf874bb5f21
999 _c15625
_d15625