000			00846nam a2200253Ia 4500
003			OSt
005			20230313144428.0
008			180620b2003 xxu||||| |||| 00| 0 eng d
020			_a140207235X
040			_cJUIT, Solan
082			_a621.395 NIC
100			_aNicolici, Nicola
245			_aPower Constrained Testing of VLSI Circuits _cby Nicola Nicolici
260			_aBoston _bKluwer Academic Publishers _c2003
300			_axi, 178p.: ill.; 25 cm.
365			_a.00
505			_aTable Of Contents: 1. Design and Test o
650			_aSemiconductors -- Thermal properties
650			_aIntegrated circuits -- Very large scale integration -- Protection
650			_aIntegrated circuits -- Very large scale integration -- Testing
700			_aAl-Hashimi, Bashir M.
906			_a2dc1bbdb7f00000101c6063a8d0a1865
942			_2ddc _cRB
999			_c16292 _d16292