| 000 | 00608nam a2200193Ia 4500 | ||
|---|---|---|---|
| 008 | 180620b2000 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a047149240X | ||
| 082 | _a621.38152 CHI | ||
| 100 | _aChim, Wai Kin | ||
| 245 |
_aSemiconductor Device and Failure Analysis: Using Photon Emission Microscopy _cWai Kin Chim |
||
| 260 |
_aSingapore _bJohn Wiley & Sons _c2000 |
||
| 300 | _axv, 269p. | ||
| 365 | _a.00 | ||
| 650 | _aSemiconductors -- Microscopy | ||
| 650 | _aSemiconductors -- Testing | ||
| 650 | _aSemiconductors -- Failures | ||
| 650 | _aPhoton emission | ||
| 906 | _a2dc6db107f00000100577e8260568c64 | ||
| 999 |
_c17614 _d17614 |
||