| 000 | 00671nam a2200229Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230403170336.0 | ||
| 008 | 180620b2007 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9788184894295 | ||
| 040 | _cJUIT, Solan | ||
| 082 | _a621.395 SAC | ||
| 100 | _aSachdev, Manoj | ||
| 245 |
_aDefect-Oriented Testing for Nano-Metric CMOS VLSI Circuits _cby Manoj Sachdev |
||
| 250 | _a2nd ed. | ||
| 260 |
_aNew Delhi _bSpringer (India) Pvt Ltd _c2007 |
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| 300 | _axxi, 328 p. | ||
| 505 | _a<p>Table of Contents:</p> <p>1. Introd | ||
| 650 | _aVLSI circuits | ||
| 700 | _aPineda de Gyvez, Jose | ||
| 906 | _a9e30a39eac1049190131a9c10b7a1092 | ||
| 942 |
_2ddc _cTB |
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| 999 |
_c44905 _d44905 |
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