| 000 | 00697nam a2200217Ia 4500 | ||
|---|---|---|---|
| 003 | OSt | ||
| 005 | 20230403135922.0 | ||
| 008 | 180620b2010 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9781891121890 | ||
| 040 | _cJUIT, Solan | ||
| 082 | _a621.3815 GAO | ||
| 100 | _aGao, Jianjun | ||
| 245 |
_aRF and Microwave Modeling and Measurement Techniques for Compound Field Effect Transistors _cby Jianjun Gao |
||
| 260 |
_aRaleigh _bSciTech Publishing _c2010 |
||
| 300 | _ax, 339p. | ||
| 505 | _a<p>Contents:</p> <p>1. Representation | ||
| 650 | _afield-effect transistors - Testing | ||
| 650 | _aCompound Semiconductors- Testing | ||
| 906 | _addb744f4ac100b20009d660867daaa57 | ||
| 942 |
_2ddc _cTB |
||
| 999 |
_c53999 _d53999 |
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