000 00524nam a2200181Ia 4500
008 180620b2007 xxu||||| |||| 00| 0 eng d
020 _a158053709X
082 _a621.3815 KEL
100 _aKelly, Joe
245 _aAdvanced Production Testing of RF, SoC, and SiP Devices
_cJoe Kelly
260 _aBostan
_bArtech House
_c2007
300 _axx, 301p.
365 _a.00
650 _aSystems on a chip -- Testing
650 _aRadio frequency
700 _aEngelhardt, Michael
906 _a2d9e48847f00000100ebd43712862d52
999 _c58735
_d58735