000 00518nam a2200157Ia 4500
008 180620b2003 xxu||||| |||| 00| 0 eng d
020 _a0852969996
082 _a621.381548 KUL
100 _aKulratna, Nihal
245 _aDigital and Analogue Instrumentation: testing and measurement
_cNihal Kulratna
260 _aUnited Kingdom
_bInstitution of Electrical Engineers (IEE)
_c2003
300 _axxix, 645p.
365 _a.00
650 _aElectronic Instruments -- Testing
906 _a2da935e67f00000100963dda0aa8d311
999 _c59288
_d59288