| 000 | 00504nam a2200157Ia 4500 | ||
|---|---|---|---|
| 008 | 180620b2004 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a1402077521 | ||
| 082 | _a004.53 HAM | ||
| 100 | _aHamdioui, Said | ||
| 245 |
_aTesting Static Random Access Memories: Defects, Fault Models and Test Patterns _cSaid Hamidoui |
||
| 260 |
_aBoston _bKluwer Academic Publishers _c2004 |
||
| 300 | _axx, 221p. | ||
| 365 | _a.00 | ||
| 650 | _aRandom Access Memories -- Testing | ||
| 906 | _a2dca7c697f0000010117f12aa35eb40f | ||
| 999 |
_c61042 _d61042 |
||