| 000 | 00565nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 180620b2006 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a0123705975 | ||
| 082 | _a621.395 WAN | ||
| 100 | _aWang, Laung Terng | ||
| 245 |
_aVLSI Test Principles and Architectures : design for testability _cEdited by Laung Terng Wang |
||
| 260 |
_aSan Francisco _bMorgan Kaufmann Publishers _c2006 |
||
| 300 | _axxiii, 777p. | ||
| 365 | _a.00 | ||
| 650 | _aComputer architecture | ||
| 700 | _aWen, Xiaoqing | ||
| 700 | _aWu, Cheng-Wen | ||
| 906 | _a2dccd0f77f0000010063dee8412a1aaf | ||
| 999 |
_c61207 _d61207 |
||