| 000 | 00662nam a2200205Ia 4500 | ||
|---|---|---|---|
| 008 | 180620b2011 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780857293091 | ||
| 082 | _a621.395 TAN | ||
| 100 | _aTan, Cher Ming | ||
| 245 |
_aApplications of Finite Element Methods for Reliability Studies on ULSI Interconnections _cCher Ming Tan |
||
| 260 |
_aNew York _bSpringer _c2011 |
||
| 300 | _avii, 150p. | ||
| 650 | _aReliability (Engineering) | ||
| 650 | _aFinite element method | ||
| 650 | _aIntegrated circuits - Ultra large scale integration | ||
| 700 | _aHou, Yuejin | ||
| 700 | _aGan, Zhenghao | ||
| 700 | _aLi, Wei | ||
| 906 | _a93488e2da9fe5f781cd402faf4af25cb | ||
| 999 |
_c63053 _d63053 |
||