| 000 | 00616nam a2200181Ia 4500 | ||
|---|---|---|---|
| 008 | 180620b2008 xxu||||| |||| 00| 0 eng d | ||
| 020 | _a9780387764863 | ||
| 082 | _a621.381548 TEH | ||
| 100 | _aTehranipoor, Mohammad H | ||
| 245 |
_aNanometer Technology Designs: high-quality delay tests _cMohammad Tehranipoor |
||
| 260 |
_aNew York, NY _bSpringer Verlag, Netherlands _c2008 |
||
| 300 | _axvii, 281p. | ||
| 650 | _aNanotechnology | ||
| 650 | _aIntegrated circuits - Very large scale integration | ||
| 650 | _aIntegrated circuits - Testing | ||
| 700 | _aAhmed, Nisar | ||
| 906 | _ab72a5b18ac1049190092d6d7a61b05d3 | ||
| 999 |
_c63307 _d63307 |
||