000 00653nam a2200229Ia 4500
003 OSt
005 20230210154021.0
008 180620b1998 xxu||||| |||| 00| 0 eng d
020 _a0137863101
040 _cJUIT, Solan
082 _a621.3815 VIN
100 _aVinnakota, Bapiraju
245 _aAnalog and Mixed Signal Test
_cby Bapiraju Vinnakota
260 _aWashington
_bPrentice Hall
_c1998
300 _axix, 261p.
365 _a.00
505 _aIncludes bibliographical references and
650 _aMixed signal circuits - testing
650 _aLinear Integrated Circuits
906 _a2d9eee9a7f0000010063663136f03e27
942 _2ddc
_cTB
999 _c7195
_d7195