OPAC_KOHA catalog › Details for: Emerging Nanotechnologies: test, defect tolerance, and reliability

Normal view MARC view ISBD view

Emerging Nanotechnologies: test, defect tolerance, and reliability by Mohammad Tehranipoor

By: Tehranipoor, MohammadMaterial type: Text

TextPublication details: New York Springer 2008Description: xii, 405pISBN: 038774746XSubject(s): NanotechnologyDDC classification: 621.381 TEH

Contents:

Contents: Section 1 Test and Defect Tol

Tags from this library: No tags from this library for this title. Log in to add tags.

Average rating: 0.0 (0 votes)

Item type	Current library	Collection	Call number	Vol info	Status	Date due	Barcode	Item holds
REFERENCE BOOK	LRC_JUIT Electronics & Communication Engineering	REFERENCE SECTION	REF 621.381 TEH (Browse shelf (Opens below))	Copy 1	Not for loan		021316

Total holds: 0

Contents:
Section 1 Test and Defect Tol

There are no comments on this title.

to post a comment.