Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Cher Ming Tan
Material type:
TextPublication details: New York Springer 2011Description: vii, 150pISBN: 9780857293091Subject(s): Reliability (Engineering) | Finite element method | Integrated circuits - Ultra large scale integrationDDC classification: 621.395 TAN
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LRC_JUIT Computer Science & Engineering | REFERENCE SECTION | REF 621.395 TAN (Browse shelf (Opens below)) | Copy 1 | Not for loan | 030697 |
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