Testing Static Random Access Memories: Defects, Fault Models and Test Patterns Said Hamidoui

By: Hamdioui, SaidMaterial type: TextTextPublication details: Boston Kluwer Academic Publishers 2004Description: xx, 221pISBN: 1402077521Subject(s): Random Access Memories -- TestingDDC classification: 004.53 HAM
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Computer Science & Engineering 		REFERENCE SECTION REF 004.53 HAM (Browse shelf (Opens below)) Copy 1 Not for loan 020297
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