Applications of Finite Element Methods for Reliability Studies on ULSI Interconnections Cher Ming Tan

By: Tan, Cher MingContributor(s): Hou, Yuejin | Gan, Zhenghao | Li, WeiMaterial type: TextTextPublication details: New York Springer 2011Description: vii, 150pISBN: 9780857293091Subject(s): Reliability (Engineering) | Finite element method | Integrated circuits - Ultra large scale integrationDDC classification: 621.395 TAN
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Item type Current library Collection Call number Vol info Status Date due Barcode Item holds
REFERENCE BOOK REFERENCE BOOK LRC_JUIT
Computer Science & Engineering 		REFERENCE SECTION REF 621.395 TAN (Browse shelf (Opens below)) Copy 1 Not for loan 030697
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